Shusuke Kawai, Takeshi Ueno, Hiroaki Ishihara, Satoshi Takaya, Koutaro Miyazaki, Kohei Onizuka, and Hiroki Ishikuro , “An Active Slew Rate Control Gate Driver IC With Robust Discrete-Time Feedback Technique for 600-V Superjunction MOSFETs”, IEEE Transactions on Power Electronics, Vol. 38, pp. 7079 – 7091, 13 February 2023
Masayuki Ichikawa, Takahisa Tanaka, Ken Uchida, Tomohisa Miyao, Munehiro Tada, and Hiroki Ishikuro, “In Situ Monitoring Technique of Self-Heating in Bulk MOSFETs at Cryogenic Temperatures using Subthreshold Current” presented at 2022 IEEE Latin American Electron Devices Conference (LAEDC), Cancun, Mexico, 04-06 July 2022
Tomohisa Miyao, Takahisa Tanaka, Itsuki Imanishi, Masayuki Ichikawa, Shuya Nakagawa, Hiroki Ishikuro, Toshitsugu Sakamoto, Munehiro Tada, and Ken Uchida, “Enhanced Drain Current in Transient Mode due to Long Ionization Time of Shallow Impurities at 4 K in 65-nm bulk Cryo CMOS Transistors” presented at 2022 Device Research Conference (DRC), Columbus, OH, USA, 26-29 June 2022
Yuya Maekawa, Hiroki Ishikuro, “An Amp-Less Time-Domain AC Bridge for Impedance Spectroscopy with 1-bit ΔΣ DAC” presented at 2021 28th IEEE International Conference on Electronics, Circuits, and Systems (ICECS), Dubai, United Arab Emirates, 28 November 2021 – 01 December 2021