Masayuki Ichikawa, Takahisa Tanaka, Ken Uchida, Tomohisa Miyao, Munehiro Tada, and Hiroki┬áIshikuro, “In Situ Monitoring Technique of Self-Heating in Bulk MOSFETs at Cryogenic Temperatures using Subthreshold Current” presented at 2022 IEEE Latin American Electron Devices Conference (LAEDC), Cancun, Mexico, 04-06 July 2022