Peter Toth, Paul Shine Eugine, Yerzhan Kudabay, Kaoru Yamashita, Sebastian Halama, Hiroki Ishikuro, Christian Ospelkaus, Vadim Issakov, “13.3 A Cryo-BiCMOS Controller for 9Be+-Trapped-Ion-Based Quantum Computers,” 2025 IEEE International Solid-State Circuits Conference (ISSCC), San Francisco, CA, USA, 2025.
K. Yamashita, K. Yoshioka, C. Ziegler, V. Issakov and H. Ishikuro, “A 4.6-373K Functional 800MS/s 12b Buffer-then-Amplify Charge-Pump-Based Pipelined TI-SAR ADC with Integrated-Active-Hold Technique,” 2025 IEEE Custom Integrated Circuits Conference (CICC), Boston, MA, USA, 2025.
Peter Toth, Paul Shine Eugine, Yerzhan Kudabay, Kaoru Yamashita, Sebastian Halama, Judi Parvizinejad, Marco Bonkowski, Hiroki Ishikuro, Christian Ospelkaus, Vadim Issakov, “A Cryo-BiCMOS Controller for Quantum Computers based on Trapped Beryllium Ions,” in IEEE Journal of Solid-State Circuits, 2024.
K. Yamashita, K. Yoshioka, C. Ziegler, V. Issakov and H. Ishikuro, “A 4.2–373 K Functional 800-MS/s 12-b Buffer-Then-Amplify Charge-Pump-Based Pipelined TI-SAR ADC With Integrated Active-Hold Technique,” in IEEE Journal of Solid-State Circuits, 2025.
Kaoru Yamashita presented our latest research on charge-pump-based pipelined ADC functional down to 4K at IEEE Custom Integrated Circuits Conference (CICC) 2025.
Dr. Huang from Iowa State University had stayed Ishikuro Lab for 3 weeks, and it’s time to go back to the US.So we organize farewell party.
We organize social gathering with Mr. Chen, OB for laboratry.
Shusuke Kawai, Takeshi Ueno, Hiroaki Ishihara, Satoshi Takaya, Koutaro Miyazaki, Kohei Onizuka, and Hiroki Ishikuro , “An Active Slew Rate Control Gate Driver IC With Robust Discrete-Time Feedback Technique for 600-V Superjunction MOSFETs”, IEEE Transactions on Power Electronics, Vol. 38, pp. 7079 – 7091, 13 February 2023
Shusuke Kawai, Takeshi Ueno, Hiroki Ishikuro, and Kohei Onizuka , “An Active Slew Rate Control Gate Driver IC With Robust Discrete-Time Feedback Technique for 600-V Superjunction MOSFETs”, IEEE Journal of Solid-State Circuits, Vol. 58, pp. 428 – 438, 2 February 2023
