Hideo Sakai, Shin-ichi O’uchi, Kazuhiko Endo, Takashi Matsukawa, Yongxun Liu, Yuki Ishikawa, Junichi Tsukada, Tadashi Nakagawa, Toshihiro Sekigawa, Hanpei Koike, Meishoku Masahara and Hiroki Ishikuro, "1/f Noise Characteristic in Independent-Double-Gate-FinFET" at 2012 International Conference on. Solid State Devices and Materials (SSDM 2012), Kyoto, Japan, Sept. 26, 2012.
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