Effects of interface traps in …
Effects of interface traps in silicon-quantum-dots-based memory structures
Impact of the Device Scaling on the Low-Frequency Noise in n-MOSFETs
Impact of the Device Scaling o…
Random telegraph signals and low-frequency noise in n-metal-oxide-semiconductor field-effect transistors with ultranarrow channels
Random telegraph signals and l…
Control of Coulomb blockade oscillations in silicon single electron transistor using silicon nano-crystal floating gates
Control of Coulomb blockade os…
Suppression of Geometric Component of Charge Pumping Current in Thin Film SOI MOSFET
Suppression of Geometric Compo…
Highly Integrated Single Electron Devices and Giga-bit Lithography
Highly Integrated Single Elect…
Room Temperature Coulomb Blockade and Low Temperature Hopping Transport in a Multiple-Dot-Channel MOSFET
Room Temperature Coulomb Block…