Measurement of Energetic and L…
Measurement of Energetic and Lateral Distribution of Interface State Density in FD SOI MOSFETs
Characteristics of Narrow Channel MOSFET Memory Based on Silicon Nanocrystals
Characteristics of Narrow Chan…
The Origin of Tunnel Barrier in Silicon Single Electron Transistor, International Conference on Physics of Semiconductors (ICPS)
The Origin of Tunnel Barrier i…
Energy Spectrum of the Quantum-Dot in a Si Single-Electron-Device
Energy Spectrum of the Quantum…
Narrow Channel MOS Memory Based on Silicon Nano-Crystals
Narrow Channel MOS Memory Base…
Fabrication of Nano-Scale Point Contact MOSFETs Using Micrometer-Scale Design Rule
Fabrication of Nano-Scale Poin…
Effects of Interface Traps on Charge Retention Characteristics in Silicon-Quantum-Dot-Based MOS Diodes
Effects of Interface Traps on …
Fabrication of Si Point Contact MOSFETs Acting as Single Electron Transistors at Room Temperature
Fabrication of Si Point Contac…
Room Temperature Coulomb Blockade and Low Temperature Hopping Transport in a Multiple-Dot-Channel MOSFET
Room Temperature Coulomb Block…
Floating Body Effects in 0.15 μm Partially Depleted SOI MOSFETs below 1 V
Floating Body Effects in 0.15 …