Measurement of Energetic and Lateral Distribution of Interface State Density in FD SOI MOSFETs ; Tran Ngoc Duyet, Hiroki Ishikuro, Yi Shi, Takuya Saraya, Makoto Takamiya, and Toshiro Hiramoto ; 1998 International Conference on Solid State Devices and Materials (SSDM’98) ; ; Hiroshima, Japan ; ; 1998/09?