Fabrication of Nano-Scale Poin…
Fabrication of Nano-Scale Point Contact MOSFETs Using Micrometer-Scale Design Rule
Effects of Interface Traps on Charge Retention Characteristics in Silicon-Quantum-Dot-Based MOS Diodes
Effects of Interface Traps on …
Influence of Quantum Confinement Effects on Single Electron and Single Hole Transistors
Influence of Quantum Confineme…
Effects of Body Reverse Pulse Bias on Geometric Component of Charge Pumping Current in FD SOI MOSFETs
Effects of Body Reverse Pulse …
Fabrication of Si Point Contact MOSFETs Acting as Single Electron Transistors at Room Temperature
Fabrication of Si Point Contac…
Room Temperature Coulomb Blockade and Low Temperature Hopping Transport in a Multiple-Dot-Channel MOSFET
Room Temperature Coulomb Block…
Floating Body Effects in 0.15 μm Partially Depleted SOI MOSFETs below 1 V
Floating Body Effects in 0.15 …
Coulomb Blockade in a Weakly Coupled Multiple-Dot-Channel MOSFET
Coulomb Blockade in a Weakly C…
Fabrication of Si Nano-Structures by Anisotropic Etching for Single Electron Device Applications
Fabrication of Si Nano-Structu…