On the origin of tunneling bar…
On the origin of tunneling barriers in silicon single electron and single hole transistors
Quantum Energy and Charging Energy in Point Contact MOSFETs acting as Single Electron Transistors
Quantum Energy and Charging En…
Characteristic Distributions of Narrow Channel Metal-Oxide-Semiconductor Field-Effect-Transistor Memories with Silicon Nanocrystal Floating Gates
Characteristic Distributions o…
Characteristics of Narrow Channel MOSFET Memory Based on Silicon Nanocrystals
Characteristics of Narrow Chan…
Effects of traps on charge storage characteristics in metal-oxide-semiconductor memory structures based on silicon nanocrystals
Effects of traps on charge sto…
Fabrication of Gate-All Around MOSFET by Silicon Anisotropic Etching Technique
Fabrication of Gate-All Around…
Suppression of Geometric Component of Charge Pumping Current in Thin Film SOI MOSFET
Suppression of Geometric Compo…
Hopping Transport in Multiple-Dot Silicon Single Electron MOSFET, Solid State Electronics
Hopping Transport in Multiple-…
Quantum mechanical effects in the silicon quantum dot in a single-electron-transistor
Quantum mechanical effects in …
Room Temperature Coulomb Blockade and Low Temperature Hopping Transport in a Multiple-Dot-Channel MOSFET
Room Temperature Coulomb Block…