Experimental Evidence for Quan…
Experimental Evidence for Quantum Mechanical Narrow Channel Effect in Ultra-Narrow MOSFETs
Effects of interface traps in silicon-quantum-dots-based memory structures
Effects of interface traps in …
Impact of the Device Scaling on the Low-Frequency Noise in n-MOSFETs
Impact of the Device Scaling o…
Random telegraph signals and low-frequency noise in n-metal-oxide-semiconductor field-effect transistors with ultranarrow channels
Random telegraph signals and l…
Control of Coulomb blockade oscillations in silicon single electron transistor using silicon nano-crystal floating gates
Control of Coulomb blockade os…
Coulomb Blockade in VLSI-Compatible Multiple-Dot and Single-Dot MOSFETs
Coulomb Blockade in VLSI-Compa…
Effects of Interface Traps on Charge Retention Characteristics in Silicon-Quantum-Dot-Based Metal-Oxide-Semiconductor Diodes
Effects of Interface Traps on …
Fabrication of Nano-Scale Point Contact Metal-Oxide-Semiconductor Field-Effect-Transistors Using Micrometer-Scale Design Rule
Fabrication of Nano-Scale Poin…
Highly Integrated Single Electron Devices and Giga-bit Lithography
Highly Integrated Single Elect…
Measurement of Energetic and Lateral Distribution of Interface State Density in FD SOI MOSFETs
Measurement of Energetic and L…