Impact of the Device Scaling on the Low-Frequency Noise in n-MOSFETs ; H. M. Bu, Y. Shi, X. L. Yuan, Y. D. Zheng, S. H. Gu, H. Majima, H. Ishikuro, and T. Hiramoto ; Applied Physics A ; ; ; V.A71/No.2/P.133 – 136 ; 2000/06?
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