Impact of the Device Scaling on the Low-Frequency Noise in n-MOSFETs ; H. M. Bu, Y. Shi, X. L. Yuan, Y. D. Zheng, S. H. Gu, H. Majima, H. Ishikuro, and T. Hiramoto ; Applied Physics A ; ; ; V.A71/No.2/P.133 – 136 ; 2000/06?
同様の投稿
Pulsed-Heating System With an Integrated Metal-Oxide Sensor Array Scheming Low-Power Temperature Modulation
3月 29, 2026Y. Shiiki et al., “Pulsed-Heating System With an Integrated Metal-Oxide Sensor Array Scheming Low-Power […]
Peter Tothが発表した論文がISSCC2026でThe Jan Van Vessem Award for Outstanding EWAA Paperを受賞しました
3月 6, 2026A Cryo-BiCMOS Controller for Quantum Computers based on Trapped Beryllium Ions
1月 12, 2026Peter Toth, Paul Shine Eugine, Yerzhan Kudabay, Kaoru Yamashita, Sebastian Halama, Judi Parvizinejad, Marco Bo […]
コメントはまだありません