Measurement of Energetic and L…
Measurement of Energetic and Lateral Distribution of Interface State Density in FD SOI MOSFETs
On the origin of tunneling barriers in silicon single electron and single hole transistors
On the origin of tunneling bar…
Quantum Energy and Charging Energy in Point Contact MOSFETs acting as Single Electron Transistors
Quantum Energy and Charging En…
Characteristic Distributions of Narrow Channel Metal-Oxide-Semiconductor Field-Effect-Transistor Memories with Silicon Nanocrystal Floating Gates
Characteristic Distributions o…
Characteristics of Narrow Channel MOSFET Memory Based on Silicon Nanocrystals
Characteristics of Narrow Chan…
Coulomb Blockade in VLSI-Compatible Multiple-Dot and Single-Dot MOSFETs
Coulomb Blockade in VLSI-Compa…
Effects of Interface Traps on Charge Retention Characteristics in Silicon-Quantum-Dot-Based Metal-Oxide-Semiconductor Diodes
Effects of Interface Traps on …
Fabrication of Nano-Scale Point Contact Metal-Oxide-Semiconductor Field-Effect-Transistors Using Micrometer-Scale Design Rule
Fabrication of Nano-Scale Poin…
Highly Integrated Single Electron Devices and Giga-bit Lithography
Highly Integrated Single Elect…
Suppression of Geometric Component of Charge Pumping Current in Thin Film SOI MOSFET
Suppression of Geometric Compo…