Effects of Interface Traps on …
Effects of Interface Traps on Charge Retention Characteristics in Silicon-Quantum-Dot-Based Metal-Oxide-Semiconductor Diodes
Effects of Interface Traps on Charge Retention Characteristics in Silicon-Quantum-Dot-Based MOS Diodes
Effects of Interface Traps on …
Suppression of Geometric Component of Charge Pumping Current in Thin Film SOI MOSFET
Suppression of Geometric Compo…
Hopping Transport in Multiple-Dot Silicon Single Electron MOSFET, Solid State Electronics
Hopping Transport in Multiple-…
Influence of Quantum Confinement Effects on Single Electron and Single Hole Transistors
Influence of Quantum Confineme…
Effects of Body Reverse Pulse Bias on Geometric Component of Charge Pumping Current in FD SOI MOSFETs
Effects of Body Reverse Pulse …
Measurement of Energetic and Lateral Distribution of Interface State Density in FD SOI MOSFETs
Measurement of Energetic and L…
Characteristics of Narrow Channel MOSFET Memory Based on Silicon Nanocrystals
Characteristics of Narrow Chan…
The Origin of Tunnel Barrier in Silicon Single Electron Transistor, International Conference on Physics of Semiconductors (ICPS)
The Origin of Tunnel Barrier i…
Effects of traps on charge storage characteristics in metal-oxide-semiconductor memory structures based on silicon nanocrystals
Effects of traps on charge sto…