Characteristics of Narrow Chan…
Characteristics of Narrow Channel MOSFET Memory Based on Silicon Nanocrystals
Measurement of Energetic and Lateral Distribution of Interface State Density in FD SOI MOSFETs
Measurement of Energetic and L…
Characteristics of Narrow Channel MOSFET Memory Based on Silicon Nanocrystals
Characteristics of Narrow Chan…
The Origin of Tunnel Barrier in Silicon Single Electron Transistor, International Conference on Physics of Semiconductors (ICPS)
The Origin of Tunnel Barrier i…
Effects of traps on charge storage characteristics in metal-oxide-semiconductor memory structures based on silicon nanocrystals
Effects of traps on charge sto…
Energy Spectrum of the Quantum-Dot in a Si Single-Electron-Device
Energy Spectrum of the Quantum…
Narrow Channel MOS Memory Based on Silicon Nano-Crystals
Narrow Channel MOS Memory Base…
Fabrication of Gate-All Around MOSFET by Silicon Anisotropic Etching Technique
Fabrication of Gate-All Around…
Fabrication of Nano-Scale Point Contact MOSFETs Using Micrometer-Scale Design Rule
Fabrication of Nano-Scale Poin…
Effects of Interface Traps on Charge Retention Characteristics in Silicon-Quantum-Dot-Based MOS Diodes
Effects of Interface Traps on …