Effects of traps on charge sto…
Effects of traps on charge storage characteristics in metal-oxide-semiconductor memory structures based on silicon nanocrystals
Energy Spectrum of the Quantum-Dot in a Si Single-Electron-Device
Energy Spectrum of the Quantum…
Narrow Channel MOS Memory Based on Silicon Nano-Crystals
Narrow Channel MOS Memory Base…
Fabrication of Gate-All Around MOSFET by Silicon Anisotropic Etching Technique
Fabrication of Gate-All Around…
Fabrication of Nano-Scale Point Contact MOSFETs Using Micrometer-Scale Design Rule
Fabrication of Nano-Scale Poin…
Effects of Interface Traps on Charge Retention Characteristics in Silicon-Quantum-Dot-Based MOS Diodes
Effects of Interface Traps on …
Suppression of Geometric Component of Charge Pumping Current in Thin Film SOI MOSFET
Suppression of Geometric Compo…
Hopping Transport in Multiple-Dot Silicon Single Electron MOSFET, Solid State Electronics
Hopping Transport in Multiple-…
Quantum mechanical effects in the silicon quantum dot in a single-electron-transistor
Quantum mechanical effects in …
Room Temperature Coulomb Blockade and Low Temperature Hopping Transport in a Multiple-Dot-Channel MOSFET
Room Temperature Coulomb Block…