Threshold Voltage Shift in Ult…
Threshold Voltage Shift in Ultra-Narrow MOSFETs by Quantum Mechanical Narrow Channel Effect
Characteristic Distributions of Narrow Channel Metal-Oxide-Semiconductor Field-Effect-Transistor Memories with Silicon Nanocrystal Floating Gates
Characteristic Distributions o…
Random Telegraph Signals in Very Narrow Channel MOSFET
Random Telegraph Signals in Ve…
Characteristics of Narrow Channel MOSFET Memory Based on Silicon Nanocrystals
Characteristics of Narrow Chan…
Coulomb Blockade in VLSI-Compatible Multiple-Dot and Single-Dot MOSFETs
Coulomb Blockade in VLSI-Compa…
Effects of Interface Traps on Charge Retention Characteristics in Silicon-Quantum-Dot-Based Metal-Oxide-Semiconductor Diodes
Effects of Interface Traps on …
Fabrication of Nano-Scale Point Contact Metal-Oxide-Semiconductor Field-Effect-Transistors Using Micrometer-Scale Design Rule
Fabrication of Nano-Scale Poin…
Highly Integrated Single Electron Devices and Giga-bit Lithography
Highly Integrated Single Elect…
Threshold Voltage Increase by Quantum Mechanical Narrow Channel Effect in Ultra-Narrow MOSFETs
Threshold Voltage Increase by …
Measurement of Energetic and Lateral Distribution of Interface State Density in FD SOI MOSFETs
Measurement of Energetic and L…