Effects of interface traps in …
Effects of interface traps in silicon-quantum-dots-based memory structures
Impact of the Device Scaling on the Low-Frequency Noise in n-MOSFETs
Impact of the Device Scaling o…
Random telegraph signals and low-frequency noise in n-metal-oxide-semiconductor field-effect transistors with ultranarrow channels
Random telegraph signals and l…
Control of Coulomb blockade oscillations in silicon single electron transistor using silicon nano-crystal floating gates
Control of Coulomb blockade os…
Large Electron Addition Energy above 250 meV in the Silicon Quantum Dot in a Single Electron Transitor
Large Electron Addition Energy…
Experimental Evidence for Quantum Mechanical Narrow Channel Effect in Ultra-Narrow MOSFETs
Experimental Evidence for Quan…
Measurement of Energetic and Lateral Distribution of Interface State Density in FD SOI MOSFETs
Measurement of Energetic and L…
A Directional Current Switch Using Silicon Single Electron Transistors Controlled by Charge Injection into Silicon Nano-Crystal Floating Dots
A Directional Current Switch U…
On the origin of tunneling barriers in silicon single electron and single hole transistors
On the origin of tunneling bar…
Characteristics of Silicon Single Electron Transistors Controlled by Charge Injection into Silicon Nano-Crystal Floating Dots
Characteristics of Silicon Sin…