Yuki Ishijima, Shuya Nakagawa and Hiroki Ishikuro, "
Measurement time reduction technique for input referred noise of dynamic comparator" presented at 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS), Austin, USA, Mar 19-22,
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松浦正詩がAPMC2023でBest Student Paper Awardを受賞しました
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